Path: Top -> Journal -> Telkomnika -> 2020 -> Vol 18, No 5, October

A new factor for fabrication technologies evaluation for silicon nanowire transistors

Journal from gdlhub / 2021-01-25 09:37:00
Oleh : Yasir Hashim, Mohammed Nazmus Shakib, Telkomnika
Dibuat : 2021-01-25, dengan 1 file

Keyword : AFM; IC; nanolithography; SiNWT; transistor;
Url : http://journal.uad.ac.id/index.php/TELKOMNIKA/article/view/12121
Sumber pengambilan dokumen : web

This paper reviews the fabrication technologies of silicon nanowire transistors (SiNWTs) and rapidly development in this area, as this paper presents various types of SiNWT structures, development of SiNWT properties and different applications until nowadays. This research provides a good comparison among fabrication technologies of SiNWTs depending on a new factor DIF, this factor depends on the size of channel and power consumption in channel. As a result of this comparison, the best technology to use in the future to fabricate silicon nano transistors for future ICs is AFM nanolithography.

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PropertiNilai Properti
ID Publishergdlhub
OrganisasiTelkomnika
Nama KontakHerti Yani, S.Kom
AlamatJln. Jenderal Sudirman
KotaJambi
DaerahJambi
NegaraIndonesia
Telepon0741-35095
Fax0741-35093
E-mail Administratorelibrarystikom@gmail.com
E-mail CKOelibrarystikom@gmail.com

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